Login / Signup
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes.
Tanay Karnik
Peter Hazucha
Jagdish Patel
Published in:
IEEE Trans. Dependable Secur. Comput. (2004)
Keyphrases
</>
low cost
high speed
process model
low power
power supply
spatio temporal
pose estimation
power consumption
news articles
event sequences