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New fault models and efficient BIST algorithms for dual-port memories.

Alaaeldin A. AminMohamed Y. OsmanRadwan E. Abdel-AalHusni Al-Muhtaseb
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
  • fault models
  • bayesian networks
  • multi agent systems
  • computational complexity
  • intrusion detection
  • fault tolerant
  • model based diagnosis