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Image-based feedback control for drift compensation in an electron microscope.
E. P. van Horssen
Bart J. Janssen
Ayush Kumar
Duarte Antunes
W. P. M. H. Heemels
Published in:
IFAC J. Syst. Control. (2020)
Keyphrases
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feedback control
electron microscope
three dimensional
closed loop
x ray
optimal control
noise level
adaptive control
open loop
feedback controller
autonomous control
computer vision
frequency domain
machine learning
image registration
multiresolution
networked control systems