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Defining Statistical Timing Sensitivity for Logic Circuits With Large-Scale Process and Environmental Variations.

Xin LiJiayong LeMustafa CelikLawrence T. Pileggi
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
  • logic circuits
  • low power
  • image analysis
  • hidden markov models
  • statistical analysis