Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering.
Jan LehrAlik SargsyanMartin PapeJan PhilippsJörg KrügerPublished in: ETFA (2020)
Keyphrases
- printed circuit boards
- anomaly detection
- unsupervised learning
- unsupervised anomaly detection
- novelty detection
- intrusion detection
- network intrusion detection
- network traffic
- anomaly based intrusion detection
- computer security
- detecting anomalies
- clustering analysis
- behavior analysis
- detect anomalies
- anomalous behavior
- semi supervised
- detecting anomalous
- one class support vector machines
- supervised learning
- clustering method
- intrusion detection system
- network anomaly detection
- object recognition
- negative selection algorithm
- neural network
- machine learning
- maximum likelihood
- network intrusion
- data analysis
- support vector machine
- named entities
- dimensionality reduction