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Towards Identity Testing for Sums of Products of Read-Once and Multilinear Bounded-Read Formulae.
Pranav Bisht
Nikhil Gupta
Ilya Volkovich
Published in:
Electron. Colloquium Comput. Complex. (2023)
Keyphrases
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higher order
high order
test cases
identity management
data sets
feature extraction
product line