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Robust Inspection of Micro-LED Chip Defects Using Unsupervised Anomaly Detection.

Sooill ParkJong Hwan Ko
Published in: ICTC (2021)
Keyphrases
  • printed circuit boards
  • high speed
  • defect detection
  • low cost
  • unsupervised anomaly detection
  • semi supervised
  • real time
  • data sets
  • association rules
  • computationally efficient
  • intrusion detection
  • analog vlsi