Login / Signup

Evolution of radiation-induced soft errors in FinFET SRAMs under process variations beyond 22nm.

Pablo RoyerFernando García-RedondoMarisa López-Vallejo
Published in: NANOARCH (2015)
Keyphrases
  • evolution process
  • genetic algorithm
  • image sequences
  • development process
  • multiscale
  • expert systems
  • mobile robot
  • x ray