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Micro LED defect detection with self-attention mechanism-based neural network.
Zebang Zhong
Cheng Li
Meiyun Chen
Heng Wu
Kiyoshi Takamasu
Published in:
Digit. Signal Process. (2024)
Keyphrases
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defect detection
attention mechanism
neural network
visual attention
feature extraction
saliency map
artificial neural networks
neural network model
textured surfaces
visual attention model
expert systems
real time
image processing
eye tracking