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Investigation on the Effect of Gate Overlap/Underlap on the 1T DRAM Cell.

Seungwon GoJae Yeon ParkShinhee KimHyung Ju NohDong Keun LeeSo Ra ParkSangwan Kim
Published in: ICEIC (2022)
Keyphrases
  • main memory
  • microscopic images
  • real world
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  • management system
  • high density
  • cmos technology