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Model Calculations for Joint Pattern Recognition and Signal Reconstruction in Cyro Electron Microscopy.
Peter C. Doerschuk
Saul B. Gelfand
Zhye Yin
Published in:
Commun. Inf. Syst. (2004)
Keyphrases
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pattern recognition
neural network
image processing
face recognition
electron microscopy
machine learning
computer vision
image analysis
signal processing
three dimensional
feature extraction
object recognition
wavelet transform