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Lessons from at-speed scan deployment on an Intel® Itanium® microprocessor.

Pankaj PantJoshua ZelmanGlenn Colón-BonetJennifer FlintSteve Yurash
Published in: ITC (2010)
Keyphrases
  • high speed
  • lessons learned
  • real time
  • artificial intelligence
  • multiscale
  • design methodology
  • e learning
  • general purpose
  • functional verification