EM SCA & FI Self-Awareness and Resilience with Single On-chip Loop & ML Classifiers.

Archisman Ghosh Debayan Das Santosh Ghosh Shreyas Sen

Published in: DATE (2022)

Keyphrases

maximum likelihood
em algorithm
decision trees
low cost
expectation maximization
supervised classification
training data
training set
generative model
analog vlsi
linear classifiers
test set
high speed
feature selection
fault tolerant
fault tolerance
data sets
high density
classification systems
majority voting