Improvements to enhance robustness of third-order scale-independent WENO-Z schemes.

Qin Li Xiao Huang Pan Yan Guozhuo Tan Yi Duan Yancheng You

Published in: CoRR (2022)

Keyphrases

case study
high robustness
object recognition
multiresolution
probabilistic model
bit rate
computational efficiency
multiple scales
geometric and photometric transformations