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Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies.

Roberto B. AlmeidaCleiton Magano MarquesPaulo F. ButzenFabio G. R. G. da SilvaRicardo A. L. ReisCristina Meinhardt
Published in: Microelectron. Reliab. (2018)
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