/TaN and SiON/TaN nMOS transistors.
Tom SchramL.-Å. RagnarssonG. S. LujanW. DeweerdJ. ChenW. TsaiK. HensonR. J. P. LanderJ. C. HookerJ. VertommenPublished in: Microelectron. Reliab. (2005)
Keyphrases
- naive bayes
- averaged one dependence estimators
- bayesian networks
- bayesian network classifiers
- data sets
- augmented naive bayes
- structure learning
- low cost
- expert systems
- neural network
- graphical models
- text mining
- power consumption
- benchmark data sets
- probabilistic model
- bayesian classifiers
- low variance
- database systems