Login / Signup
A Systematic Review of Deep Learning for Silicon Wafer Defect Recognition.
Uzma Batool
Mohd Ibrahim Shapiai
Muhammad Tahir
Zool Hilmi Ismail
Noor Jannah Zakaria
Ahmed Elfakharany
Published in:
IEEE Access (2021)
Keyphrases
</>
deep learning
systematic review
unsupervised learning
empirical studies
unsupervised feature learning
object recognition
machine learning
deep architectures
pattern recognition
mental models
feature extraction
action recognition
weakly supervised
decision making
restricted boltzmann machine
pairwise
supervised learning
multiscale
data sets