A Systematic Review of Deep Learning for Silicon Wafer Defect Recognition.
Uzma BatoolMohd Ibrahim ShapiaiMuhammad TahirZool Hilmi IsmailNoor Jannah ZakariaAhmed ElfakharanyPublished in: IEEE Access (2021)
Keyphrases
- deep learning
- systematic review
- unsupervised learning
- empirical studies
- unsupervised feature learning
- object recognition
- machine learning
- deep architectures
- pattern recognition
- mental models
- feature extraction
- action recognition
- weakly supervised
- decision making
- restricted boltzmann machine
- pairwise
- supervised learning
- multiscale
- data sets