Neural Network for Enhancing Microscopic Resolution Based on Images from Scanning Electron Microscope.
Chia-Hung Dylan TsaiChia-Hao YehPublished in: Sensors (2021)
Keyphrases
- neural network
- image analysis
- image database
- input image
- image resolution
- scanning electron microscope
- image data
- three dimensional
- test images
- image retrieval
- lighting conditions
- image features
- image registration
- spatial information
- edge detection
- image collections
- artificial neural networks
- object recognition
- image annotation
- rigid body
- neural network is trained
- image classification
- computer graphics
- low resolution
- high resolution
- feature vectors
- feature extraction
- image sequences
- keypoints
- visual features
- image quality
- image set
- multiple images
- similarity measure
- lower resolution
- highest resolution
- image segmentation