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Yield prediction for 3D capacitive interconnections.

Alberto FazziLuca MagagniMario de DominicisPaolo ZoffoliRoberto CanegalloPier Luigi RolandiAlberto L. Sangiovanni-VincentelliRoberto Guerrieri
Published in: ICCAD (2006)
Keyphrases
  • prediction accuracy
  • prediction error
  • prediction model
  • prediction algorithm
  • support vector
  • linear prediction
  • objective function
  • long term
  • high density
  • data sets
  • information systems
  • cooperative
  • multiresolution