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Reliability inference for VGA adapter from dual suppliers based on contaminated type-I interval-censored data.
Tzong-Ru Tsai
Hon Keung Tony Ng
Hoang Pham
Yuhlong Lio
Jyun-You Chiang
Published in:
Qual. Reliab. Eng. Int. (2019)
Keyphrases
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supply chain
type ii
probabilistic inference
bayesian inference
grammatical inference
dynamic range
supplier selection
reliability analysis
inference mechanism
low latency
efficient learning
noisy data
bayesian networks
structured prediction
decision making
probabilistic reasoning
decision makers
data structure