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Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm.

S. JayanthyM. C. BhuvaneswariKeesarapalli Sujitha
Published in: VLSI Design (2012)
Keyphrases
  • matching algorithm
  • learning algorithm
  • vlsi circuits
  • data sets
  • database
  • feature space
  • low cost
  • test generation