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Full-chip vectorless dynamic power integrity analysis and verification against 100uV/100ps-resolution measurement.

Shen LinMakoto NagataKenji ShimazakiKazuhiro SatohMasaya SumitaHiroyuki TsujikawaAndrew T. Yang
Published in: CICC (2004)
Keyphrases
  • statistical analysis
  • neural network
  • data analysis
  • low cost
  • low resolution
  • real time
  • image analysis
  • multiresolution
  • high resolution
  • formal analysis
  • circuit design