Detection of CMOS Defects under Variable Processing Conditions.

Amy Germida James F. Plusquellic

Published in: VTS (2000)

Keyphrases

high speed
false alarms
low power
real time
object detection
sufficient conditions
detection method
automatic detection
detection accuracy
false positives
power consumption
event detection
defect detection
image sensor
random access
environmental conditions
detection algorithm
neural network