HIER: Metric Learning Beyond Class Labels via Hierarchical Regularization.
Sungyeon KimBoseung JeongSuha KwakPublished in: CVPR (2023)
Keyphrases
- class labels
- metric learning
- labeled data
- semi supervised
- distance metric
- learning tasks
- supervised learning
- unlabeled data
- multi label
- training data
- multi task
- dimensionality reduction
- pairwise
- semi supervised learning
- distance function
- feature space
- feature set
- data samples
- unsupervised learning
- training set
- transfer learning
- learning algorithm
- background knowledge
- data points
- domain knowledge
- neural network