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Noise estimation for deep sub-micron integrated circuits.

Bin ChenHuazhong YangHui Wang
Published in: Sci. China Ser. F Inf. Sci. (2001)
Keyphrases
  • noise estimation
  • integrated circuit
  • electron beam
  • noise level
  • noisy images
  • denoising
  • wyner ziv video coding
  • additive noise
  • multiscale
  • printed circuit boards