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Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications.

Chandrasekharan KothandaramanX. ChenDan MoyD. LeaSami RosenblattFaraz KhanDerek LeuToshiaki KirihataD. IoannouG. La RosaJ. B. JohnsonNorman RobsonSubramanian S. Iyer
Published in: IRPS (2015)
Keyphrases
  • memory requirements
  • memory usage
  • high temperature
  • low memory
  • computational power
  • data mining
  • low cost
  • learning systems
  • field effect transistors
  • data sets