A Full-Chip ESD Protection Circuit Simulation and Fast Dynamic Checking Method Using SPICE and ESD Behavior Models.
Feilong ZhangChenkun WangFei LuQi ChenCheng LiX. Shawn WangDaguang LiAlbert Z. WangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2019)
Keyphrases
- significant improvement
- probabilistic model
- high accuracy
- cost function
- statistical methods
- machine learning methods
- monte carlo simulation
- modeling method
- high speed
- statistical model
- segmentation method
- clustering method
- prior knowledge
- neural network
- analog vlsi
- prediction model
- analytical model
- dynamic characteristics
- linear regression
- verification method
- mathematical model
- parameter estimation
- dynamic environments
- model selection
- edge detection
- dynamic programming
- preprocessing
- computational complexity