Mixup-based classification of mixed-type defect patterns in wafer bin maps.
Wooksoo ShinHyungu KahngSeoung Bum KimPublished in: Comput. Ind. Eng. (2022)
Keyphrases
- decision trees
- support vector
- lung disease
- feature extraction
- pattern recognition
- pattern analysis
- support vector machine svm
- classification accuracy
- discovering patterns
- classification models
- supervised learning
- image classification
- multi class
- machine learning
- classification systems
- automatic classification
- feature vectors
- pattern representation
- classification process
- class labels
- pattern classification
- classification method
- classification algorithm
- decision rules
- frequent patterns
- svm classifier
- text classification
- support vector machine
- feature selection