Reliability assessment on new reprogrammable non-volatile memory devices based on SiCr-O.
Yuan LiRomain DelangleXiao-mei ZhangBart HovensPublished in: Microelectron. Reliab. (2011)
Keyphrases
- reliability assessment
- main memory
- bp neural network model
- power system
- memory usage
- flash memory
- data storage
- memory requirements
- data structure
- mobile devices
- memory space
- embedded devices
- storage devices
- file system
- artificial intelligence
- mobile applications
- embedded systems
- index structure
- context aware
- memory size
- database management systems
- neural network