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Hot electrons induced degradation in lattice-matched InAlN/GaN high electron mobility transistors.
Jian Ren
Dawei Yan
Wenjie Mou
Yang Zhai
Guofeng Yang
Xiaofeng Gu
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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electron beam
high energy
integrated circuit
electric field
wide range
mobile agents
power consumption
database
data sets
context aware
low power
boolean algebra