Optimizing Random Forest-Based Inference on RISC-V MCUs at the Extreme Edge.
Enrico TabanelliGiuseppe TagliaviniLuca BeniniPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- random forest
- random forests
- decision trees
- feature set
- fold cross validation
- application specific
- multi label
- ensemble learning
- feature importance
- bayesian networks
- rotation forest
- base classifiers
- decision tree learning algorithms
- feature selection
- ensemble methods
- prediction accuracy
- image classification
- supervised learning
- object recognition