Metric Driven Classification: A Non-Parametric Approach Based on the Henze-Penrose Test Statistic.
Sally GhanemHamid KrimHamilton Scott ClouseWesam A. SaklaPublished in: IEEE Trans. Image Process. (2018)
Keyphrases
- test statistic
- support vector machine svm
- training samples
- classification accuracy
- machine learning methods
- distribution free
- roc curve
- hypothesis testing
- decision trees
- feature space
- support vector machine
- supervised learning
- mutual information
- support vector
- feature selection
- cost sensitive
- evaluation metrics
- statistical tests
- null hypothesis