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Towards Automated Identification of Layering Violations in Embedded Applications (WIP).

Mingjie ShenJames C. DavisAravind Machiry
Published in: LCTES (2023)
Keyphrases
  • semi automated
  • embedded systems
  • fully automated
  • automatic identification
  • computer assisted
  • databases
  • database
  • data mining
  • search engine
  • preprocessing
  • data driven
  • watermarking algorithm
  • identification rate