Login / Signup

Identification and measurement of fibers in scanning electron microscopy images using a high-order correlation process.

Oscar Yáñez-SuárezMahmood R. Azimi-Sadjadi
Published in: IEEE Trans. Instrum. Meas. (1999)
Keyphrases
  • high order
  • microscopy images
  • higher order
  • pairwise
  • low order
  • electron microscopy
  • markov random field
  • bayesian logistic regression