A new method for testing mixed analog and digital circuits.
Janusz RzeszutBozena KaminskaYvon SavariaPublished in: Asian Test Symposium (1995)
Keyphrases
- dynamic programming
- digital circuits
- high precision
- preprocessing
- segmentation method
- synthetic data
- cost function
- detection method
- experimental evaluation
- matching algorithm
- significant improvement
- pairwise
- objective function
- databases
- support vector machine svm
- segmentation algorithm
- database
- pattern matching
- reinforcement learning