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A Low-Leakage, Robust ESD Clamp with Thyristor Delay Element in 65 nm CMOS Technology.

Mahdi ElghazaliManoj SachdevAjoy Opal
Published in: ISVLSI (2016)
Keyphrases
  • cmos technology
  • power dissipation
  • low power
  • power consumption
  • low voltage
  • parallel processing
  • high speed
  • spl times
  • silicon on insulator
  • real time