Exploration of Fault Effects on Formal RISC-V Microarchitecture Models.

Simon Tollec Mihail Asavoae Damien Couroussé Karine Heydemann Mathieu Jan

Published in: FDTC (2022)

Keyphrases

statistical models
probabilistic model
failure modes
database
real time
data sets
computer systems
formal model
classification models
mathematical models
application specific
formal models
accurate models