Login / Signup
A jitter characterization system using a component-invariant Vernier delay line.
Antonio H. Chan
Gordon W. Roberts
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2004)
Keyphrases
</>
knowledge base
information retrieval
artificial neural networks
invariant features
data sets
learning algorithm
image processing
clustering algorithm
decision trees
pattern recognition
multiresolution
image quality
moment invariants