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A New Graph-Based Method for Class Imbalance in Surface Defect Recognition.

Yucheng WangLiang GaoXinyu LiYiping GaoXiaotong Xie
Published in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
  • class imbalance
  • pattern recognition
  • classification accuracy
  • feature selection
  • pairwise
  • pattern classification
  • sampling methods