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Parasitic Effects in Multi-Gate MOSFETs.
Yusuke Kobayashi
C. Raghunathan Manoj
Kazuo Tsutsui
Venkanarayan Hariharan
Kuniyuki Kakushima
V. Ramgopal Rao
Parhat Ahmet
Hiroshi Iwai
Published in:
IEICE Trans. Electron. (2007)
Keyphrases
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data mining
computer based instruction
databases
case study
three dimensional
multiresolution
mobile robot
negative effects