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Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview.

G. R. Srinivasan
Published in: IBM J. Res. Dev. (1996)
Keyphrases
  • error rate
  • integrated circuit
  • test set
  • lower error rates
  • electron beam
  • word error rate
  • rule sets
  • character recognition
  • equal error rate