Highly Tunable MOCVD Process of Vanadium Dioxide Thin Films: Relationship between Structural/Morphological Features and Electrodynamic Properties.

Anna Lucia PellegrinoFrancesca Lo PrestiGian Paolo PapariCan KoralAntonello AndreoneGraziella Malandrino
Published in: Sensors (2023)
Keyphrases
  • morphological features
  • thin film
  • database systems
  • similarity measure
  • viewpoint
  • grain size