TSV open defects in 3D integrated circuits: characterization, test, and optimal spare allocation.

Fangming Ye Krishnendu Chakrabarty

Published in: DAC (2012)

Keyphrases

integrated circuit
printed circuit boards
optimal allocation
closed form
optimal solution
electron beam
allocation policy
dynamic programming
worst case
load balancing
resource allocation
optimal strategy
social welfare
dynamic allocation
hardware description language