Task Specific Top-Down Visual Attention Based on Local Pattern Analysis and Histogram Backprojection for Fast Object Localization.
Yiping ShenShuxiao LiChengfei ZhuHongxing ChangPublished in: CIT (2014)
Keyphrases
- pattern analysis
- object localization
- back projection
- visual attention
- object based visual attention
- mean shift
- image reconstruction
- super resolution
- pattern recognition
- eye tracking
- saliency map
- eye movements
- higher level
- vision system
- object detection
- pattern classification
- image analysis
- computational intelligence
- high level
- object categories
- bounding box
- higher order
- object classes
- ground plane
- motion estimation
- low level
- visual features
- high resolution
- data analysis