SARO: A State-Aware Reliability Optimization Technique for High Density NAND Flash Memory.
Myungsuk KimYoungsun SongMyoungsoo JungJihong KimPublished in: ACM Great Lakes Symposium on VLSI (2018)
Keyphrases
- flash memory
- high density
- solid state
- low density
- garbage collection
- main memory
- file system
- buffer management
- embedded systems
- disk drives
- life cycle
- random access
- storage devices
- close proximity
- b tree
- database systems
- high bandwidth
- hand held devices
- high power
- magnetic recording
- data storage
- storage systems
- data center
- magnetic tape
- memory management
- multi dimensional
- low cost
- data model
- databases
- real time