On fault probabilities and yield models for VLSI neural networks.

Paul M. Furth Andreas G. Andreou

Published in: IEEE J. Solid State Circuits (1997)

Keyphrases

neural network
pattern recognition
fault diagnosis
statistical models
data sets
neural nets
neural network model
probabilistic model
artificial neural networks
experimental data
decision making
machine learning
prior knowledge
high speed
parameter estimation
real time
neural models