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SI-SMART: Functional test generation for RTL circuits using loop abstraction and learning recurrence relationships.

Prateek PuriMichael S. Hsiao
Published in: ICCD (2015)
Keyphrases
  • test generation
  • learning process
  • learning algorithm
  • high level
  • reinforcement learning
  • information technology
  • databases
  • image processing
  • xml data