Login / Signup

Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian Inference.

Zhengqi GaoJun TaoYangfeng SuDian ZhouXuan ZengXin Li
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • bayesian inference
  • probabilistic model
  • prior information
  • variational inference
  • machine learning
  • bayesian model
  • feature selection
  • pairwise
  • hyperparameters