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Reliability, Yield and Stress Burn-in: A Unified Approach for Microelectronics Systems Manufacturing and Software Development.
Francisco J. Samaniego
Published in:
Technometrics (1999)
Keyphrases
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software development
distributed systems
intelligent systems
software components
manufacturing processes
learning systems
software developers
case study
expert systems
management system
computer systems
building blocks
application development
quality control
model driven development