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Mini-Tutorial: Bridging the Gap between TCAD and ECAD Methodologies in Deep Sub-Micron Interconnect Extraction and Analysis.

Nagaraj NsPoras T. BalsaraCyrus D. Cantrell
Published in: VLSI Design (1999)
Keyphrases
  • computer vision
  • databases
  • neural network
  • artificial intelligence
  • social networks
  • decision trees
  • image analysis
  • high speed
  • automatic extraction